Search for content and authors
 

Growth of atomically-smooth droplet-free AlxGa1-xN (x>0.5) layers by plasma assisted molecular beam epitaxy under strong metal-rich conditions

Dmitrii Nechaev 1Valentin N. Jmerik 1Pavel N. Brunkov 1Sergey I. Troshkov 1Ahmed Y. Alyamani 2Sergey V. Ivanov 1

1. Ioffe Physico-Technical Institute, RAS, Saint-Petersburg, Russian Federation
2. King Abdulaziz City for Science and Technology (KACST), Riyadh P.O. Box 6086, Riyadh 11442, Saudi Arabia

Abstract

Plasma assisted molecular beam epitaxy (PA MBE) is one of the main technologies for manufacturing AlGaN heterostructures with a high Al content, emitting within wide UV spectral range down to a wavelength of 210 nm. The structural quality of UV-emitting devices can be improved by a precise control of the stoichiometric conditions during PA MBE that allows one to grow AlGaN layers with either rough or atomically smooth droplet-free surface morphology at the nitrogen- or metall-rich conditions, respectively. The paper reports on growth kinetics of AlxGa1-xN films with high Al content (x>0.5) at the metal-rich conditions. Also we propose a new pulsed growth technique to achieve the atomically-smooth droplet-free film surface.
The AlxGa1-xN/AlN/c-Al2O3 (x=0.5-0.8) samples were grown at substrate temperature (TS) gradually varied from 650 to 800ºC using the group-III-to-activated nitrogen flux ratio (III/N) in the 1.1-2.2 range. In situ laser reflectometry and pyrometry measurements were used to determine growth rate (or alloy composition) as well as to estimate the metal(Ga) desorption rate and group III excess on the growth surface. The AlGaN growth kinetics data were used to obtain droplet-free AlGaN layers under the strong Ga-rich conditions at TS=700-730ºC by using the controlled short-term interruptions of either only metal or all growth fluxes. Although optical and scanning electron microscopes revealed the droplets-free surface for the films grown by both techniques, the cracking effect was observed for the growth with only metal flux interruptions. This is explained by the formation of strained GaN insertions due to Ga surface segregation, leading to the tensile stress in AlGaN layers. Uncracked atomically-smooth surface with RMS~0.4 nm over area of 2x2 μm2 was achieved for the 600-nm-thick Al0.8Ga0.2N films grown at III/N=2.2 with the short-term interruptons of all fluxes.

 

Legal notice
  • Legal notice:
 

Related papers

Presentation: Poster at 17th International Conference on Crystal Growth and Epitaxy - ICCGE-17, Topical Session 3, by Dmitrii Nechaev
See On-line Journal of 17th International Conference on Crystal Growth and Epitaxy - ICCGE-17

Submitted: 2013-04-11 10:44
Revised:   2013-04-16 17:32