Application of Si-strip detector in X-ray crystallographic texture measurement

Leszek Tarkowski ,  Jan Bonarski 

Polish Academy of Sciences, Institute of Metallurgy and Materials Sciences (IMIM PAN), Reymonta 25, Kraków 30-059, Poland

Abstract

Traditionally applied method registration of a pole figure by means of the the X-ray diffraction technique is based on the usage of a single slit detector (point counter) at the fixed 2-theta position. However, examination of the crystallographic texture of multi-phase and lower symmetry materials requires registration of wider diffraction spectra when compared to e.g. pure metals. This procedure can be done by scanning the chosen range of the 2-theta angle with the single-slit detector (pseudo-PSD mode) or by applying the position-sensitive (linear) detector, or an area detector.
The work presents application of the linear Si-strip detector in the classic X'Pert system equipped with texture attachment. Full integration of the new detector with existing hardware enabled to use the new measurement possibilities and reduction of the pole figures registration time. Various examples of measured profiles and pole figures are presented.

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Presentation: poster at E-MRS Fall Meeting 2004, Symposium D, by Leszek Tarkowski
See On-line Journal of E-MRS Fall Meeting 2004

Submitted: 2004-07-02 16:29
Revised:   2009-06-08 12:55
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