OIM and X-ray texture analysis of melt-textured YBCO superconductors

Anjela D. Koblischka-Veneva 2Michael R. Koblischka 1F Mücklich 2M. Murakami 3,4

1. University of Saarbruecken, Institute of Experimental Physics (USAAR), P.O.Box 151150, Saarbrücken 66041, Germany
2. University of the Saarland, Institute for Functional Materials, P.O.Box 15 11 50, Saarbrücken 66041, Germany
3. International Superconductivity Technology Centre, Superconductivity Research Laboratory (SRL/ISTEC), 1-10-13, Shinonome, Koto-ku, Tokyo 135-0062, Japan
4. Department of Materials Science and Engineering, Shibaura Institute of Technology, 3-9-14, Shibaura,Minato-ku, Tokyo 108-8548, Japan

Abstract

In this contribution, we compare the results of an X-ray based pole figure texture analysis with the local texture analysis by means of Orientation imaging microscopy (OIM) technique. As samples, we employ two different melt-textured YBCO samples; one fully processed and one without oxygen treatment. To enable the direct comparison of the two techniques, we employ the [103] pole figures. The OIM results are presented in form of phase maps, misorientation angle distributions and two-dimensional pole figures. The X-ray texture data are presented in form of two- and three-dimensional [103] pole figures.
We find a clear coincidence between the results obtained by the two measurement techniques on our samples, however, the OIM results are much more detailed, yielding the local grain orientation distribution and quantitative results of the grain or subgrain misorientation angles. Therefore, the OIM measurements give information not accessible to the X-ray pole figure analysis.

 

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Presentation: poster at E-MRS Fall Meeting 2004, Symposium E, by Anjela D. Koblischka-Veneva
See On-line Journal of E-MRS Fall Meeting 2004

Submitted: 2004-04-29 17:01
Revised:   2009-06-08 12:55