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A study of surface and segregation energies of single crystalline Cu by means of XPS

Nail R. Chamsoutdinov ,  Amarante J. Bottger ,  Wim G. Sloof 

University of Technology Delft, Rotterdamseweg 137, Delft 2628 AL, Netherlands

Abstract

Experimental values for segregation energies or surface energies are difficult to obtain. Surface (segregation) energies of metals can be related to peak shifts caused by the presence of a surface in an X-ray photoelectron spectroscopy (XPS) experiment. For industrially important 3-d metals this proved to be difficult because of the complicated background and large intrinsic peak widths. In this experimental study of single crystalline copper a new approach to XPS-profile fitting is applied, which allows discerning the contributions of surface and bulk to the spectra. Special emphasis was made on intrinsic XPS-background description. It was demonstrated that the intrinsic background is strongly affected by the surface, its type and quality. Proper account for these factors in fitting routines allowed us to separate the surface contribution to the total XPS-intensity and to report the first successful extraction of surface core-level shifts for copper (100) and (111) surfaces. The experimental results were compared to the surface energy estimations obtained by the semi-empirical Miedema macroscopic atom model. The experimental results were found in a good agreement with the trends predicted by this model.

 

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Presentation: oral at E-MRS Fall Meeting 2004, Symposium I, by Nail R. Chamsoutdinov
See On-line Journal of E-MRS Fall Meeting 2004

Submitted: 2004-04-29 13:39
Revised:   2009-06-08 12:55