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Lattice dynamics studies by inelastic x-ray scattering

Michael Krisch 

European Synchrotron Radiation Facility, Grenoble, France

Abstract

Starting from pioneering work in the 1980’s [1], and profiting from the development of dedicated synchrotron radiation sources and performing x-ray optics, inelastic x-ray scattering (IXS) with meV energy resolution has become a powerful tool in the study of phonon dispersion in condensed matter. The most important aspects distinguishing IXS from inelastic neutron scattering (INS) techniques, are the absence of kinematic limitations and the possibility to study very small samples (down to 10-5 mm3). This has opened up new possibilities in a range of research fields. The talk will illustrate the present capabilites of the technique by discussing a few representative examples of recent reseach conducted on beamline ID28 at the ESRF. These shall comprise studies at high pressure using diamond anvil cell techniques [2], work on BN [3], and experiments probing phonons in the near-surface region [4,5]. The presentation shall conclude with the discussion of some novel applications and perspectives.

[1] E. Burkel; Inelastic Scattering of X-Rays with Very High Energy Resolution; Springer Tracts in Modern Physics, volume 125, Springer Verlag, Berlin (1991).[2] M. Krisch; J. Raman Spectros. 34, 628 (2003).[3] J. Serrano, A. Bosak, R. Arenal, M. Krisch, K. Watanabe, T.Taniguchi, H. Kanda, A. Rubio, and L. Wirtz; Phys. Rev. Lett. 98, 095503 (2007).[4] B.M. Murphy, M. Müller, J. Stettner, H. Requardt, J. Serrano, M. Krisch, W.Press;

J. Phys.: Cond. Matt. 20, 224001 (2008).

[5] H. Reichert, F. Bencivenga, B. Wehinger, M. Krisch, F. Sette, and H. Dosch; Phys. Rev. Lett. 98, 096104 (2007).

 

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Presentation: Invited oral at E-MRS Fall Meeting 2008, Symposium A, by Michael Krisch
See On-line Journal of E-MRS Fall Meeting 2008

Submitted: 2008-06-27 12:58
Revised:   2009-06-07 00:48