X-ray imaging using 2D semiconductor detectors

Jean-Pierre Ponpon 

CNRS, PHASE Laboratory, Strasbourg, France


Semiconductor nuclear radiation detectors are nowadays of current use for high resolution spectrometry in a number of fields, including those involving X-rays measurements. The significant advances achieved during the last ten years in materials properties, detector characteristics, and high quality electronic systems, make now possible to go one step further and to build 2D X-rays imaging systems based on semiconductor detectors. It is the aim of this paper to present the state of the art of X-rays imaging systems based on such devices.
We’ll first focus on the basic principles involved. We’ll try to discuss the main requirements (detector size, spatial resolution, pixels number, dynamics, counting rate, etc.) and limitations (physical and experimental limitations), with respect to the applications envisaged (scientific, medical or industrial imaging). The major properties of the semiconductors of interest for such applications will be briefly summarized.
Then the working principles and main characteristics of existing systems based on various semiconductor materials and devices will be reviewed and compared to those of conventional X-rays imagers.
Finally, possible evolutions will be discussed in terms of new detector materials and new semiconductor devices, taking into account the increasing potential of microelectronics technology.

Legal notice
  • Legal notice:

    Copyright (c) Pielaszek Research, all rights reserved.
    The above materials, including auxiliary resources, are subject to Publisher's copyright and the Author(s) intellectual rights. Without limiting Author(s) rights under respective Copyright Transfer Agreement, no part of the above documents may be reproduced without the express written permission of Pielaszek Research, the Publisher. Express permission from the Author(s) is required to use the above materials for academic purposes, such as lectures or scientific presentations.
    In every case, proper references including Author(s) name(s) and URL of this webpage: http://science24.com/paper/1638 must be provided.


Presentation: invited oral at E-MRS Fall Meeting 2004, Symposium D, by Jean-Pierre Ponpon
See On-line Journal of E-MRS Fall Meeting 2004

Submitted: 2004-04-15 09:35
Revised:   2009-06-08 12:55
Web science24.com
© 1998-2022 pielaszek research, all rights reserved Powered by the Conference Engine