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Micro-Raman scattering of semiconductor nanostructures

Andres Cantarero 

Universidad de Valencia-ICMUV (ICMUV), Polígono La Coma s/n, Valencia 46980, Spain

Abstract

Micro-Raman scattering is a non destructive characterization tool which allows us to extract local and valuable information of semiconductor nanostructures. The technique can be applied to analyze first and second order phase transitions, anharmonicities, strain states of the nanostructures, etc. Playing with the wavelength, resonance Raman scattering can provide information of single quantum objects. We will describe here the main techniques based on Raman scattering applied to nanostructures, some experimental examples and some models of the vibrational properties of nanostructures.

 

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Presentation: Invited oral at E-MRS Fall Meeting 2008, Symposium A, by Andres Cantarero
See On-line Journal of E-MRS Fall Meeting 2008

Submitted: 2008-06-09 12:46
Revised:   2009-06-07 00:48