Search for content and authors
 

XDB – a combined mass balance and full profile fit approach to quantitative phase analysis

István E. Sajó 

Hungarian Academy of Sciences, Chemical Research Centre (CRC/HAS), Pusztaszeri ut 59-67, Budapest H-1025, Hungary

Abstract

A full profile fit program was developed to evaluate X-ray powder diffraction scans with a special emphasize on quantitaive phase composition. The program runs in the 32 bit MS Windows environments and comes with an easy to use and intuitive user interface.
The software starts from PDF2 style reference data ( the {d,I,hkl} sets of reflections) for each phase, that allows the profile fit for structureless phases too. Line shapes are modelled with the Pearson VII profile function. Appropriate corrections can be applied for preferred orientation (March-Dollase model) and mass absorption contrast (Brindley model).
Phase proportions are derived from the weight parameters of the profile fit corrected with their respective I/Ic coefficient. The calculated phase proportions depend on the particle size of the components and the absolute amounts (phase percentages) are normalized to the sum of the phases. These parameters can not be derived from the profile fit, they need to be determined independently. To improve the precision and reliability of phase quantification, the chemical composition of the sample is calculated from the phase percentages and compared to the values obtained from elemental analysis. The difference of calculated and analyzed chemistry (mass balance fit) can be refined simultaneously with the profile fit.
A fair amount of experience accumulated in analyzing various multiphase samples (ceramics, catalysts, cements, corrosion products, bauxites, ores, etc.) proves that this approach provides a fast and reliable way for phase quantification.

 

Legal notice
  • Legal notice:
 

Presentation: Poster at 11th European Powder Diffraction Conference, Poster session, by István E. Sajó
See On-line Journal of 11th European Powder Diffraction Conference

Submitted: 2008-05-04 17:21
Revised:   2009-06-07 00:48