The Incoatec Microfocus Source IμS™ (see figure 1) is a suitable X-ray source for home-lab diffractometry applications. It incorporates an optimized combination of an extremely bright and very durable stationary air-cooled 30 W microfocus source and the newest type of 2-dim beam shaping multilayer optics, the so called Quazar™ optics.

Figure 1: IμS™ with Quazar™ optics and collimator.

The IμS™ is a very versatile instrument available with copper or molybdenium anode and can be used with virtually any existing diffractometer-detector-system. Integrations are already done within Bruker and mar systems.

Due to the specially designed beam shaping Quazar™ optics, a focussing or collimating of the beam is possible. Also a hybrid-optics focussing in one direction and collimating in the other is available. The optics consist of bent substrates with shape tolerances below 100 nm, upon which multilayers are deposited with single layer thicknesses in the nanometer range and up to several hundreds of layer pairs. Additionally these multilayers were designed with lateral thickness gradients within ± 1% deviation of the ideal shape. This means that a deposition precision in the picometer range is needed. We use sputtering methods for deposition and optical profilometry in order to characterize the shape and X-ray reflectometry to characterize the multilayers. The beam parameters like monochromaticity, flux, brilliance and divergence demonstrate the quality of the multilayer optics for different lab applications, e.g. single crystal diffraction, powder diffraction, or small angle X-ray scattering. Measurements in the fields of phase identification, structure solution, stress and texture analysis and many others can be done.

We tested the IμS™ in combination with 2-dim detectors on samples in different geometries. Results of the tests are shown. They are compared with measurements of typical sealed tube and rotating anode systems.

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1. Microfocus solutions for X-ray diffractometry with area detectors
2. Investigating phase transitions under non ambient conditions using the Incoatec Microfocus Source IμS™