Multi- layer composite based on amorphous materials and quasicrystals, deposited by laser ablation

Waldemar Mroz 3Miroslaw Jelinek 5Lukasz Major 2Jerzy Morgiel 2Artur Prokopiuk 3Michal J. Wozniak 1Koichi Kasuya 4

1. Warsaw University of Technology, Faculty of Materials Science and Engineering (InMat), Wołoska 141, Warszawa 02-507, Poland
2. Polish Academy of Sciences, Institute of Metallurgy and Materials Sciences (IMIM PAN), Reymonta 25, Kraków 30-059, Poland
3. Military University of Technology, Institute of Optoelectronic (MUT), Wołoska, Warszawa 02-507, Poland
4. Department of Energy Science, Interdisciplinary Graduate Schol of Scienceand Engineering, Tokyo Institute of Technology, Midori-ku,Yokohama 226, Nagatsuta 4259, Japan
5. Czech Academy of Sciences, Institute of Physics, Na Slovance 2, Prague 182-21, Czech Republic


The PLD method allows to produce multi-layers materials. Interest in pulsed laser deposition (PLD), as a technology producing thin layers of complex materials is growing rapidly in recent years. Condensation from the vapor phase at rapid solidification favors the nano-structure formation in the thin layers.
First attempts have been made to produce multi-layers composite. Amorphous material is treated as a matrix. Materials, which were used for coatings, were:
- amorphous material: Ti25at.% Zr20at.% Ni27.5at.% Cu27.5at.%,
- quasicrystals: Al65at.%Cu23at.%Fe12at.%.
Amorphous materials have high elasticity and in the compression test they exhibit plastic features. This is the reason that these materials are used as a matrix.
As a hard phase, quasicrystals have been deposited. Quasicrystals have a periodic structure, however they have strong diffraction peaks. They are characterized by icosahedral symmetry (5- rotation axis symmetry).
Amorphous and quasicrystalline thin layers were fabricated by pulsed laser deposition (PLD) using an excimer, ArF laser (Lambda = 193 nm). Scanning electron microscopy (SEM) and atomic force microscopy (AFM) observations have been done to examine the topography and chemical composition of coatings. Texture analyses were carried out for the deposited amorphous as well as for the quasicrystalline substrate. Application of the pseudo-position sensitive detector in texture examination allows drawing the pole figures of residual stresses.

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Presentation: poster at E-MRS Fall Meeting 2003, Symposium G, by Lukasz Major
See On-line Journal of E-MRS Fall Meeting 2003

Submitted: 2003-07-09 15:47
Revised:   2009-06-08 12:55
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