The structural analysis of thin cerium dioxides films doped with Cu , elaborated by the laser ablation techniques for catalytic and gas sensor application, was the general aim of this study. The thin films deposited on a (100) silicon substrate were of nanocrystalline structure with well-developed texture. The morphology as well as the privileged films orientation are changed with the volume fraction of Cu. The observed changes affect on the catalytic properties of the obtained materials. It was confirmed by the performed catalytic tests with CH4.

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