E-MRS Fall Meeting 2004

No.	Presenting person	Title
C-01	Asghar Asgari Tokaldani	Theoretical model of transport characteristics of AlGaN/GaN High electron mobility transistors
C-02	Hong-Ying Chen	Argon ion beam voltages influence the changes of microstructure and chemical composition of aluminum nitride films in dual ion beam sputtering system
C-03	Vitalij G. Deibuk	Charge transfer and thermodynamic stability of ternary nitride solid solutions
C-05	Janusz Karpinski	Al_xGa_{1-x}N bulk single crystals: Temperature dependence of Al solubility
C-06	Marek Godlewski	Influence of n-type doping on light emission properties of GaN layers and GaN-based quantum well structures
C-07	Min Gong	Annealing Behaviors of Void-like Defects in SiO_2/SiC Probed by Slow-Positron-Beam
C-08	Lucja Gorczyca	Microstructure of homoepitaxially grown InGaN/GaN, violet light emitting laser diodes.
C-09	Barbara Kalandyk	Microstructure Strength Relationship in Microalloyed Cast Steels
C-10	Eliana Kaminska	Thermally stable Ru-Si-O gate electrode for AlGaN/GaN HEMT
C-11	Eliana Kaminska	TaSiN, TiSiN and TiWN diffusion barriers for metallization systems to GaN
C-12	Michal Kaminski	GaN growth by Sublimation Sandwich Method
C-13	Krzysztof P. Korona	Recombination Dynamics in GaN/AlGaN Low Dimensional Structures Obtained by SiH_4 Treatment
C-14	Iwona A. Kowalik	Interaction of Mn and Ti atoms with GaN surface - a resonant photoemission study
C-15	Krzysztof Pakuła	Spontaneous Superlattice Formation in MOCVD Growth of AlGaN
C-16	Yong Seob Park	HARDNESS AND LUBRICATION PROPERTIES OF CN_X THIN FILMS GROWN BY CLOSE FIELD UNBALANCED MAGNETRON SPUTTERING
C-17	Matthieu PETIT	Nitridation of InP(100) surfaces studied by synchrotron radiation
C-18	J. O. Schmitt	Close-Spaced Crystal Growth and Characterization of BP Crystals
C-19	Tomasz Wojtowicz	The atomic structure of defects formed during doping of GaN with rare earth ions
C-20	Tomasz Wojtowicz	Transmission electron microscopy structural investigations of Tm implanted GaN
C-21	Thomas Wolff	Automated Electrochemical CV-Profiling of semiconductor structures on wafer scale

E-MRS Fall Meeting 2004

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